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Very Low Power CMOS SRAM 2M X 8 bit
Pb-Free and Green package materials are compliant to RoHS
BS62LV1600
n FEATURES
Y Wide VCC operation voltage : 2.4V ~ 5.5V Y Very low power consumption : VCC = 3.0V Operation current : 46mA (Max.) at 55ns 2mA (Max.) at 1MHz Standby current : 1.5uA (Typ.) at 25 OC VCC = 5.0V Operation current : 115mA (Max.) at 55ns 10mA (Max.) at 1MHz Standby current : 6.0uA (Typ.) at 25OC Y High speed access time : -55 55ns (Max.) at VCC : 3.0~5.5V -70 70ns (Max.) at VCC : 2.7~5.5V Y Automatic power down when chip is deselected Y Easy expansion with CE1, CE2 and OE options Y Three state outputs and TTL compatible Y Fully static operation Y Data retention supply voltage as low as 1.5V
n DESCRIPTION
The BS62LV1600 is a high performance, very low power CMOS Static Random Access Memory organized as 2048K by 8 bits and operates form a wide range of 2.4V to 5.5V supply voltage. Advanced CMOS technology and circuit techniques provide both high speed and low power features with typical CMOS standby current of 1.5uA at 3.0V/25OC and maximum access time of 55ns at 3.0V/85OC. Easy memory expansion is provided by an active LOW chip enable (CE1), an active HIGH chip enable (CE2), and active LOW output enable (OE) and three-state output drivers. The BS62LV1600 has an automatic power down feature, reducing the power consumption significantly when chip is deselected. The BS62LV1600 is available in JEDEC standard 44-pin TSOP II and 48-ball BGA package.
n POWER CONSUMPTION
POWER DISSIPATION PRODUCT FAMILY
BS62LV1600EC BS62LV1600FC BS62LV1600EI BS62LV1600FI
OPERATING TEMPERATURE
Commercial +0OC to +70OC Industrial -40OC to +85OC
STANDBY
(ICCSB1, Max)
Operating
(ICC, Max)
PKG TYPE
VCC=3.0V 10MHz fMax.
VCC=5.0V
VCC=3.0V
1MHz
VCC=5.0V 10MHz
fMax.
1MHz
50uA
8.0uA
9mA
48mA
113mA
1.5mA
19mA
45mA
TSOP II-44 BGA-48-0912
100uA
16uA
10mA
50mA
115mA
2mA
20mA
46mA
TSOP II-44 BGA-48-0912
n PIN CONFIGURATIONS
A4 A3 A2 A1 A0 CE1 NC NC DQ0 DQ1 VCC VSS DQ2 DQ3 NC A20 WE A19 A18 A17 A16 A15 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 A5 A6 A7 OE CE2 A8 NC NC DQ7 DQ6 VSS VCC DQ5 DQ4 NC NC A9 A10 A11 A12 A13 A14
n BLOCK DIAGRAM
A20 A13 A17 A15 A18 A16 A14 A12 A7 A6 A5 A4
Address Input Buffer
12
Row Decoder
4096
Memory Array
BS62LV1600EC BS62LV1600EI
4096 x 4096
4096 DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 8 8 Data Input Buffer 8 512 Column Decoder 9 Control Address Input Buffer 8 Column I/O Write Driver Sense Amp
1 A NC
2 OE
3 A0
4 A1
5 A2
6 CE2
Data Output Buffer
B
NC
NC
A3
A4
CE1
NC
C
DQ0
NC
A5
A6
NC
DQ4
D
VSS
DQ1
A17
A7
DQ5
VCC
CE1 CE2 WE OE VCC VSS
A11 A9 A8 A3 A2 A1 A0 A10 A19
E
VCC
DQ2
NC
A16
DQ6
VSS
F
DQ3
NC
A14
A15
NC
DQ7
G
NC
A20
A12
A13
WE
NC
H
A18
A8
A9
A10
A11
A19
48-ball BGA top view
Brilliance Semiconductor, Inc. reserves the right to change products and specifications without notice.
R0201-BS62LV1600
1
Revision 2.2 Jan. 2006
BS62LV1600
n PIN DESCRIPTIONS
Name
A0-A20 Address Input CE1 Chip Enable 1 Input CE2 Chip Enable 2 Input WE Write Enable Input
Function
These 21 address inputs select one of the 2048K x 8-bit in the RAM
CE1 is active LOW and CE2 is active HIGH. Both chip enables must be active when data read form or write to the device. If either chip enable is not active, the device is deselected and is in standby power mode. The DQ pins will be in the high impedance state when the device is deselected. The write enable input is active LOW and controls read and write operations. With the chip selected, when WE is HIGH and OE is LOW, output data will be present on the DQ pins; when WE is LOW, the data present on the DQ pins will be written into the selected memory location. The output enable input is active LOW. If the output enable is active while the chip is selected and the write enable is inactive, data will be present on the DQ pins and they will be enabled. The DQ pins will be in the high impendence state when OE is inactive. There 8 bi-directional ports are used to read data from or write data into the RAM.
OE Output Enable Input
DQ0-DQ7 Data Input/Output Ports VCC VSS
Power Supply Ground
n TRUTH TABLE MODE
Not selected (Power Down) Output Disabled Read Write
CE1
H X L L L
CE2
X L H H H
WE
X X H H L
OE
X
I/O OPERATION
High Z
VCC CURRENT
ICCSB, ICCSB1 ICC ICC ICC
X H L X High Z DOUT DIN
n ABSOLUTE MAXIMUM RATINGS
SYMBOL
VTERM TBIAS TSTG PT IOUT
(1)
n OPERATING RANGE
UNITS
V
O
PARAMETER
Terminal Voltage with Respect to GND Temperature Under Bias Storage Temperature Power Dissipation DC Output Current
RATING
-0.5(2) to 7.0 -40 to +125 -60 to +150 1.0 20
RANG
Commercial Industrial
AMBIENT TEMPERATURE
0OC to + 70OC -40OC to + 85OC
VCC
2.4V ~ 5.5V 2.4V ~ 5.5V
C C
O
W mA
n CAPACITANCE
(1)
(TA = 25 C, f = 1.0MHz)
O
SYMBOL PAMAMETER CONDITIONS MAX. UNITS
CIN CIO Input Capacitance Input/Output Capacitance VIN = 0V VI/O = 0V 10 12 pF pF
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. -2.0V in case of AC pulse width less than 30 ns. R0201-BS62LV1600
1. This parameter is guaranteed and not 100% tested.
2
Revision 2.3 May. 2006
BS62LV1600
n DC ELECTRICAL CHARACTERISTICS (TA =-40 C to +85 C)
PARAMETER NAME VCC VIL VIH IIL ILO VOL VOH ICC(5) ICC1 ICCSB ICCSB1(6) PARAMETER
Power Supply Input Low Voltage Input High Voltage Input Leakage Current Output Leakage Current Output Low Voltage Output High Voltage Operating Power Supply Current Operating Power Supply Current Standby Current - TTL Standby Current - CMOS VIN = 0V to VCC VI/O = 0V to V CC, CE1= VIH or CE2= VIL, or OE = VIH V CC = Max, IOL = 2.0mA V CC = Min, IOH = -1.0mA CE1 = VIL and CE2 = VIH, IDQ = 0mA, f = FMAX(4) CE1 = VIL and CE2 = VIH, IDQ = 0mA, f = 1MHz CE1 = VIH, or CE2 = VIL, IDQ = 0mA CE1VCC-0.2V or CE20.2V, VINV CC-0.2V or VIN0.2V
VCC=3.0V VCC=5.0V VCC=3.0V VCC=5.0V VCC=3.0V VCC=5.0V VCC=3.0V VCC=5.0V
O
O
TEST CONDITIONS
MIN.
2.4 -0.5(2) 2.2 ---2.4 -----
TYP.(1)
----------1.5 6.0
MAX.
5.5 0.8 VCC+0.3(3) 1 1 0.4 -46 115 2 10 1.0 2.0 16 100
UNITS
V V V uA uA V V mA mA mA uA
1. Typical characteristics are at TA=25OC and not 100% tested. 2. Undershoot: -1.0V in case of pulse width less than 20 ns. 3. Overshoot: VCC+1.0V in case of pulse width less than 20 ns.
4. FMAX=1/tRC. 5. ICC(MAX.) is 45mA/113mA at VCC=3.0V/5.0V and TA=70OC. 6. ICCSB1(MAX.) is 8.0uA/50uA at VCC=3.0V/5.0V and TA=70OC.
n DATA RETENTION CHARACTERISTICS (TA = -40 C to +85 C)
SYMBOL VDR ICCDR(3) tCDR tR PARAMETER
VCC for Data Retention Data Retention Current Chip Deselect to Data Retention Time Operation Recovery Time
O
O
TEST CONDITIONS
CE1VCC-0.2V or CE20.2V, VINVCC-0.2V or VIN0.2V CE1VCC-0.2V or CE20.2V, VINVCC-0.2V or VIN0.2V
MIN.
1.5 -0
TYP. (1)
-0.7 ---
MAX.
-8.0 ---
UNITS
V uA ns ns
See Retention Waveform tRC (2)
1. VCC=1.5V, TA=25OC and not 100% tested. 2. tRC = Read Cycle Time. 3. ICCRD(Max.) is 4.0uA at TA=70OC.
n LOW VCC DATA RETENTION WAVEFORM (1) (CE1 Controlled)
Data Retention Mode VDR1.5V
VCC
VIH
VCC
VCC
tCDR
CE1VCC - 0.2V
tR
VIH
CE1
R0201-BS62LV1600
3
Revision 2.3 May. 2006
BS62LV1600
n LOW VCC DATA RETENTION WAVEFORM (2) (CE2 Controlled)
Data Retention Mode VDR1.5V
VCC
VCC
VCC
tCDR
tR
CE20.2V
CE2
VIL
VIL
n AC TEST CONDITIONS
(Test Load and Input/Output Reference)
n KEY TO SWITCHING WAVEFORMS
WAVEFORM INPUTS MUST BE STEADY MAY CHANGE FROM "H" TO "L" MAY CHANGE FROM "L" TO "H" DON'T CARE ANY CHANGE PERMITTED DOES NOT APPLY OUTPUTS MUST BE STEADY WILL BE CHANGE FROM "H" TO "L" WILL BE CHANGE FROM "L" TO "H" CHANGE : STATE UNKNOW CENTER LINE IS HIGH INPEDANCE "OFF" STATE
Input Pulse Levels Input Rise and Fall Times Input and Output Timing Reference Level Output Load tCLZ, tOLZ, tCHZ, tOHZ, tWHZ Others
Vcc / 0V 1V/ns 0.5Vcc CL = 5pF+1TTL CL = 30pF+1TTL ALL INPUT PULSES
1 TTL Output CL(1)
VCC GND
10%
90%
90% 10%
Rise Time : 1V/ns
Fall Time : 1V/ns
1. Including jig and scope capacitance.
n AC ELECTRICAL CHARACTERISTICS (TA = -40 C to +85 C) READ CYCLE
JEDEC PARANETER PARAMETER NAME NAME DESCRIPTION Read Cycle Time Address Access Time Chip Select Access Time Chip Select Access Time Output Enable to Output Valid Chip Select to Output Low Z Chip Select to Output Low Z Output Enable to Output Low Z Chip Select to Output High Z Chip Select to Output High Z Output Enable to Output High Z Data Hold from Address Change (CE1) (CE2) (CE1) (CE2) (CE1) (CE2) CYCLE TIME : 55ns (VCC =3.0~5.5V) MIN. TYP. MAX. 55 ----10 10 10 ---10 -------------55 55 55 25 ---30 30 25 -CYCLE TIME : 70ns (VCC = 2.7~5.5V) MIN. TYP. MAX. 70 ----10 10 10 ---10 -------------70 70 70 30 ---35 35 30 -UNITS ns ns ns ns ns ns ns ns ns ns ns ns
O
O
tAVAX tAVQX tE1LQV tE2HQV tGLQV tE1LQX tE2HQX tGLQX tE1HQZ tE2LQZ tGHQZ tAVQX
tRC tAA tACS1 tACS2 tOE tCLZ1 tCLZ2 tOLZ tCHZ1 tCHZ2 tOHZ tOH
R0201-BS62LV1600
4
Revision 2.3 May. 2006
BS62LV1600
n SWITCHING WAVEFORMS (READ CYCLE) READ CYCLE 1
(1,2,4)
tRC ADDRESS tOH DOUT tAA tOH
READ CYCLE 2 CE1
(1,3,4)
tACS1 CE2 tCLZ DOUT
(5)
tACS2 tCHZ1, tCHZ2
(5)
READ CYCLE 3
(1, 4)
tRC ADDRESS tAA OE tOE CE1 tCLZ1 CE2
(5) tCLZ2 (5)
tOH
tOLZ tACS1 tOHZ tCHZ1
(5) (1,5)
tACS2
tCHZ2
(1,5)
DOUT
NOTES: 1. WE is high in read Cycle. 2. Device is continuously selected when CE1 = VIL and CE2= VIH. 3. Address valid prior to or coincident with CE1 transition low and/or CE2 transition high. 4. OE = VIL. 5. Transition is measured 500mV from steady state with CL = 5pF. The parameter is guaranteed but not 100% tested.
R0201-BS62LV1600
5
Revision 2.3 May. 2006
BS62LV1600
n AC ELECTRICAL CHARACTERISTICS (TA = -40 C to +85 C) WRITE CYCLE
JEDEC PARANETER PARAMETER NAME NAME DESCRIPTION Write Cycle Time Address Set up Time Address Valid to End of Write Chip Select to End of Write Write Pulse Width Write Recovery Time Write Recovery Time Write to Output High Z Data to Write Time Overlap Data Hold from Write Time Output Disable to Output in High Z End of Write to Output Active (CE1, WE) (CE2) CYCLE TIME : 55ns (VCC = 3.0~5.5V) MIN. TYP. MAX. 55 0 40 40 30 0 0 -25 0 -5 -------------------25 --25 -CYCLE TIME : 70ns (VCC = 2.7~5.5V) MIN. TYP. MAX. 70 0 50 50 35 0 0 -30 0 -5 -------------------30 --30 -UNITS ns ns ns ns ns ns ns ns ns ns ns ns
O O
tAVAX tAVWL tAVWH tE1LWH tWLWH tWHAX tE2LAX tWLQZ tDVWH tWHDX tGHQZ tWHQX
tWC tAS tAW tCW tWP tWR1 tWR2 tWHZ tDW tDH tOHZ tOW
n SWITCHING WAVEFORMS (WRITE CYCLE) WRITE CYCLE 1
(1)
tWC ADDRESS tWR1 OE tCW CE1
(5) (11) (3)
CE2
(5)
tAW WE tAS tOHZ DOUT
(4,10)
tCW
(11)
tWR2
(2)
(3)
tWP
tDH tDW DIN
R0201-BS62LV1600
6
Revision 2.3 May. 2006
BS62LV1600
WRITE CYCLE 2
(1,6)
tWC ADDRESS tCW
(11)
CE1
(5)
CE2
(5)
tAW WE tAS tWHZ DOUT
(4,10)
tCW
(11) (2)
tWP
tWR2
(3)
tOW tDW tDH
(8,9)
(7)
(8)
DIN
NOTES: 1. WE must be high during address transitions. 2. The internal write time of the memory is defined by the overlap of CE1 and CE2 active and WE low. All signals must be active to initiate a write and any one signal can terminate a write by going inactive. The data input setup and hold timing should be referenced to the second transition edge of the signal that terminates the write. 3. tWR is measured from the earlier of CE1 or WE going high or CE2 going low at the end of write cycle. 4. During this period, DQ pins are in the output state so that the input signals of opposite phase to the outputs must not be applied. 5. If the CE1 low transition or the CE2 high transition occurs simultaneously with the WE low transitions or after the WE transition, output remain in a high impedance state. 6. OE is continuously low (OE = VIL). 7. DOUT is the same phase of write data of this write cycle. 8. DOUT is the read data of next address. 9. If CE1 is low and CE2 is high during this period, DQ pins are in the output state. Then the data input signals of opposite phase to the outputs must not be applied to them. 10. Transition is measured 500mV from steady state with CL = 5pF. The parameter is guaranteed but not 100% tested. 11. tCW is measured from the later of CE1 going low or CE2 going high to the end of write.
R0201-BS62LV1600
7
Revision 2.3 May. 2006
BS62LV1600
n ORDERING INFORMATION
BS62LV1600
X
X
Z
YY
SPEED 55: 55ns 70: 70ns PKG MATERIAL -: Normal G: Green, RoHS Compliant P: Pb free, RoHS Compliant GRADE C: +0oC ~ +70oC I: -40oC ~ +85oC
PACKAGE E: TSOP II-44 F: BGA-48-0912
Note: BSI (Brilliance Semiconductor Inc.) assumes no responsibility for the application or use of any product or circuit described herein. BSI does not authorize its products for use as critical components in any application in which the failure of the BSI product may be expected to result in significant injury or death, including life-support systems and critical medical instruments.
n PACKAGE DIMENSIONS
TSOP II-44
R0201-BS62LV1600
8
Revision 2.3 May. 2006
BS62LV1600
n PACKAGE DIMENSIONS (continued)
0.250.05
NOTES: 1: CONTROLLING DIMENSIONS ARE IN MILLIMETERS. 2: PIN#1 DOT MARKING BY LASER OR PAD PRINT. 3: SYMBOL "N" IS THE NUMBER OF SOLDER BALLS.
1.4 Max.
SIDE VIEW
D 3.375
0.1
N 48
D 12.0
E 9.0
D1 5.25
E1 3.75
e 0.75
D1
SOLDER BALL 0.35 0.05
e
VIEW A
48 mini-BGA (9mm x 12mm)
R0201-BS62LV1600
2.625
E0.1
E1
9
Revision 2.3 May. 2006
BS62LV1600
n Revision History Revision No. 2.2 History Add Icc1 characteristic parameter Improve Iccsb1 spec. I-grade from 220uA to 100uA at 5.0V 20uA to 16uA at 3.0V C-grade from 110uA to 50uA at 5.0V 10uA to 8.0uA at 3.0V Change I-grade operation temperature range - from -25OC to -40OC Draft Date Jan. 13, 2006 Remark
2.3
May. 25, 2006
R0201-BS62LV1600
10
Revision 2.3 May. 2006

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